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"Narrow Gap Detection in Microscope Images Using Marked Point Process Modeling."
Dae Woo Kim et al. (2019)
- Dae Woo Kim, Camilo Aguilar
, Huixi Zhao, Mary L. Comer:
Narrow Gap Detection in Microscope Images Using Marked Point Process Modeling. IEEE Trans. Image Process. 28(10): 5064-5076 (2019)
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