"The Local Geometry of Testing in Ellipses: Tight Control via Localized ..."

Yuting Wei, Martin J. Wainwright (2020)

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DOI: 10.1109/TIT.2020.2981313

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type: Journal Article

metadata version: 2024-10-15

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Yuting Wei, Martin J. Wainwright:
The Local Geometry of Testing in Ellipses: Tight Control via Localized Kolmogorov Widths. IEEE Trans. Inf. Theory 66(8): 5110-5129 (2020)

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