"Deep Classifiers with Label Noise Modeling and Distance Awareness."

Vincent Fortuin et al. (2022)

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DOI: —

access: open

type: Journal Article

metadata version: 2023-06-26

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  - journals/tmlr/FortuinCWALTLBJK22
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  - https://dblp.org/rec/journals/tmlr/FortuinCWALTLBJK22
Vincent Fortuin, Mark Collier, Florian Wenzel, James Urquhart Allingham, Jeremiah Zhe Liu, Dustin Tran, Balaji Lakshminarayanan, Jesse Berent, Rodolphe Jenatton, Effrosyni Kokiopoulou:
Deep Classifiers with Label Noise Modeling and Distance Awareness. Trans. Mach. Learn. Res. 2022 (2022)

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