"Enhancing Flash Memory Reliability by Jointly Considering Write-back ..."

Tseng-Yi Chen et al. (2018)

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DOI: 10.1145/3229192

access: closed

type: Journal Article

metadata version: 2023-06-26

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Tseng-Yi Chen, Yuan-Hao Chang, Yuan-Hung Kuan, Ming-Chang Yang, Yu-Ming Chang, Pi-Cheng Hsiu:
Enhancing Flash Memory Reliability by Jointly Considering Write-back Pattern and Block Endurance. ACM Trans. Design Autom. Electr. Syst. 23(5): 64:1-64:24 (2018)

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