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"Gate-level test generation for sequential circuits."

Kwang-Ting Cheng (1996)

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DOI: 10.1145/238997.238999

access: closed

type: Journal Article

metadata version: 2022-12-07

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Kwang-Ting Cheng:
Gate-level test generation for sequential circuits. ACM Trans. Design Autom. Electr. Syst. 1(4): 405-442 (1996)

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