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"Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin ..."

Min-Hsiung Hsieh, Shuen-Lin Jeng (2007)

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DOI: 10.1109/TR.2007.903276

access: closed

type: Journal Article

metadata version: 2020-07-09

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Min-Hsiung Hsieh, Shuen-Lin Jeng:
Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. IEEE Trans. Reliab. 56(3): 369-380 (2007)

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