"An Expectation-Based Scoring Approach for Explainable Software Defect ..."

Yamin Hu, Yuhui Shi, Wenjian Luo (2026)

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DOI: 10.1109/TR.2026.3661636

access: closed

type: Journal Article

metadata version: 2026-03-12

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Yamin Hu, Yuhui Shi, Wenjian Luo:
An Expectation-Based Scoring Approach for Explainable Software Defect Prediction. IEEE Trans. Reliab. 75: 888-901 (2026)

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