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"Estimating component-defect probability from masked system success/failure ..."
Benjamin Reiser, Betty J. Flehinger, Andrew R. Conn (1996)
- Benjamin Reiser, Betty J. Flehinger, Andrew R. Conn:
Estimating component-defect probability from masked system success/failure data. IEEE Trans. Reliab. 45(2): 238-243 (1996)
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