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"A Two-Level Inspection Model With Technological Insertions."

Wenbin Wang et al. (2012)

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DOI: 10.1109/TR.2012.2183911

access: closed

type: Journal Article

metadata version: 2020-07-09

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Wenbin Wang, Matthew J. Carr, Tommy W. S. Chow, Michael G. Pecht:
A Two-Level Inspection Model With Technological Insertions. IEEE Trans. Reliab. 61(2): 479-490 (2012)

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