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"On random testing for combinational circuits with a high measure of ..."

Sunil R. Das, Wen-Ben Jone (1992)

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DOI: 10.1109/21.156587

access: closed

type: Journal Article

metadata version: 2020-05-20

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Sunil R. Das, Wen-Ben Jone:
On random testing for combinational circuits with a high measure of confidence. IEEE Trans. Syst. Man Cybern. 22(4): 748-754 (1992)

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