"Principal Line-Based Alignment Refinement for Palmprint Recognition."

Wei Li et al. (2012)

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DOI: 10.1109/TSMCC.2012.2195653

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type: Journal Article

metadata version: 2023-08-13

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Wei Li, Bob Zhang, Lei Zhang, Jingqi Yan:
Principal Line-Based Alignment Refinement for Palmprint Recognition. IEEE Trans. Syst. Man Cybern. Part C 42(6): 1491-1499 (2012)

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