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"Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs."

Nima Aghaee, Zebo Peng, Petru Eles (2015)

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DOI: 10.1109/TVLSI.2014.2380477

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/AghaeePE15
Nima Aghaee, Zebo Peng, Petru Eles:
Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs. IEEE Trans. Very Large Scale Integr. Syst. 23(12): 2992-3005 (2015)

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