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"Analysis of the Impact of Process Variations and Manufacturing Defects on ..."

Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty (2020)

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DOI: 10.1109/TVLSI.2020.2976734

access: closed

type: Journal Article

metadata version: 2020-06-16

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  - journals/tvlsi/BanerjeeCC20
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  - https://dblp.org/rec/journals/tvlsi/BanerjeeCC20
Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty:
Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs. IEEE Trans. Very Large Scale Integr. Syst. 28(6): 1513-1526 (2020)

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