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"Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS."
Xin Chen et al. (2023)
- Xin Chen, Yuxin Bai, Jianpeng Cao, Lei Wang, Xinjie Zhou, Ying Zhang, Weiqiang Liu:
Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS. IEEE Trans. Very Large Scale Integr. Syst. 31(7): 1039-1050 (2023)
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