"Test pattern generation and partial-scan methodology for an asynchronous ..."

Aristides Efthymiou, John Bainbridge, Douglas A. Edwards (2005)

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DOI: 10.1109/TVLSI.2005.862722

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type: Journal Article

metadata version: 2023-09-30

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Aristides Efthymiou, John Bainbridge, Douglas A. Edwards:
Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect. IEEE Trans. Very Large Scale Integr. Syst. 13(12): 1384-1393 (2005)

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