"Optimization of Small-Delay Defects Test Quality by Clock Speed Selection ..."

Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault (2020)

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DOI: 10.1109/TVLSI.2019.2949037

access: closed

type: Journal Article

metadata version: 2020-03-19

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Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault:
Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage. IEEE Trans. Very Large Scale Integr. Syst. 28(3): 764-776 (2020)

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