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"ADC/DAC Loopback Linearity Testing by DAC Output Offsetting and Scaling."

Xuan-Lun Huang, Jiun-Lang Huang (2011)

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DOI: 10.1109/TVLSI.2010.2063443

access: closed

type: Journal Article

metadata version: 2020-03-11

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Xuan-Lun Huang, Jiun-Lang Huang:
ADC/DAC Loopback Linearity Testing by DAC Output Offsetting and Scaling. IEEE Trans. Very Large Scale Integr. Syst. 19(10): 1765-1774 (2011)

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