"Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs."

Shao-Chun Hung et al. (2021)

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DOI: 10.1109/TVLSI.2021.3108787

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type: Journal Article

metadata version: 2021-12-15

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Shao-Chun Hung, Yi-Chen Lu, Sung Kyu Lim, Krishnendu Chakrabarty:
Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1875-1888 (2021)

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