"Analyzing the Impact of Joint Optimization of Cell Size, Redundancy, and ..."

Nam Sung Kim et al. (2012)

> Home

Details and statistics

DOI: 10.1109/TVLSI.2011.2173220

access: closed

type: Journal Article

metadata version: 2021-04-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tvlsi/KimDZKGP12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/KimDZKGP12
Nam Sung Kim, Stark C. Draper, Shi-Ting Zhou, Sumeet Katariya, Hamid Reza Ghasemi, Taejoon Park:
Analyzing the Impact of Joint Optimization of Cell Size, Redundancy, and ECC on Low-Voltage SRAM Array Total Area. IEEE Trans. Very Large Scale Integr. Syst. 20(12): 2333-2337 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.