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"On-Chip SOC Test Platform Design Based on IEEE 1500 Standard."

Kuen-Jong Lee et al. (2010)

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DOI: 10.1109/TVLSI.2009.2019978

access: closed

type: Journal Article

metadata version: 2020-03-11

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Kuen-Jong Lee, Tong-Yu Hsieh, Chin-Yao Chang, Yu-Ting Hong, Wen-Cheng Huang:
On-Chip SOC Test Platform Design Based on IEEE 1500 Standard. IEEE Trans. Very Large Scale Integr. Syst. 18(7): 1134-1139 (2010)

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