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"Offset-Canceling Single-Ended Sensing Scheme With One-Bit-Line Precharge ..."

Taehui Na et al. (2019)

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DOI: 10.1109/TVLSI.2019.2925931

access: closed

type: Journal Article

metadata version: 2020-12-29

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  - https://dblp.org/rec/journals/tvlsi/NaSCKKJ19
Taehui Na, Byungkyu Song, Sara Choi, Jung Pill Kim, Seung-Hyuk Kang, Seong-Ook Jung:
Offset-Canceling Single-Ended Sensing Scheme With One-Bit-Line Precharge Architecture for Resistive Nonvolatile Memory in 65-nm CMOS. IEEE Trans. Very Large Scale Integr. Syst. 27(11): 2548-2555 (2019)

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