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"Graphical I_DDQ Signatures Reduce Defect Level and Yield Loss."

Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal (2007)

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DOI: 10.1109/TVLSI.2007.904128

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/RaoBA07
Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal:
Graphical I_DDQ Signatures Reduce Defect Level and Yield Loss. IEEE Trans. Very Large Scale Integr. Syst. 15(11): 1245-1255 (2007)

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