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"Hotspots Elimination and Temperature Flattening in VLSI Circuits."

Benjamin Carrión Schäfer, Taewhan Kim (2008)

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DOI: 10.1109/TVLSI.2008.2001140

access: closed

type: Journal Article

metadata version: 2020-12-29

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  - journals/tvlsi/SchaferK08
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  - https://dblp.org/rec/journals/tvlsi/SchaferK08
Benjamin Carrión Schäfer, Taewhan Kim:
Hotspots Elimination and Temperature Flattening in VLSI Circuits. IEEE Trans. Very Large Scale Integr. Syst. 16(11): 1475-1487 (2008)

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