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"Analytical models and algorithms for the efficient signal integrity ..."

Seongkyun Shin et al. (2004)

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DOI: 10.1109/TVLSI.2004.825836

access: closed

type: Journal Article

metadata version: 2022-06-10

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  - https://dblp.org/rec/journals/tvlsi/ShinEES04
Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. IEEE Trans. Very Large Scale Integr. Syst. 12(4): 395-407 (2004)

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