"Analog Probe Module (APM) for Enhanced IC Observability: From Concept to ..."

Anshaj Shrivastava, Gaurab Banerjee (2024)

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DOI: 10.1109/TVLSI.2024.3470342

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type: Journal Article

metadata version: 2025-01-08

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Anshaj Shrivastava, Gaurab Banerjee:
Analog Probe Module (APM) for Enhanced IC Observability: From Concept to Application. IEEE Trans. Very Large Scale Integr. Syst. 32(12): 2355-2367 (2024)

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