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"Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under ..."

Kan Takeuchi et al. (2008)

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DOI: 10.1109/TVLSI.2008.2000975

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - https://dblp.org/rec/journals/tvlsi/TakeuchiYKKMKYS08
Kan Takeuchi, Atsushi Yoshikawa, Michio Komoda, Ken Kotani, Hiroaki Matsushita, Yusaku Katsuki, YuyoYamamoto, Takao Sato:
Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. IEEE Trans. Very Large Scale Integr. Syst. 16(11): 1559-1566 (2008)

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