"Joint Data Rate and EMF Exposure Analysis in Manhattan Environments: ..."

Charles Wiame et al. (2024)

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DOI: 10.1109/TVT.2023.3307226

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type: Journal Article

metadata version: 2024-02-10

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Charles Wiame, Simon Demey, Luc Vandendorpe, Philippe De Doncker, Claude Oestges:
Joint Data Rate and EMF Exposure Analysis in Manhattan Environments: Stochastic Geometry and Ray Tracing Approaches. IEEE Trans. Veh. Technol. 73(1): 894-908 (2024)

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