"CLARQ: A Dynamic ARQ Solution for Ultra-High Closed-Loop Reliability."

Bin Han et al. (2022)

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DOI: 10.1109/TWC.2021.3095165

access: closed

type: Journal Article

metadata version: 2023-11-12

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Bin Han, Yao Zhu, Muxia Sun, Vincenzo Sciancalepore, Yulin Hu, Hans D. Schotten:
CLARQ: A Dynamic ARQ Solution for Ultra-High Closed-Loop Reliability. IEEE Trans. Wirel. Commun. 21(1): 280-294 (2022)

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