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"Random Pattern Testability Enhancement by Circuit Rewiring."
Shih-Chieh Chang et al. (2001)
- Shih-Chieh Chang, Kwen-Yo Chen, Ching-Hsiang Cheng, Wen-Ben Jone, Sunil R. Das:
Random Pattern Testability Enhancement by Circuit Rewiring. VLSI Design 12(4): 537-549 (2001)
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