"Antirandom Testing: A Distance-Based Approach."

Shen Hui Wu et al. (2008)

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DOI: 10.1155/2008/165709

access: open

type: Journal Article

metadata version: 2018-11-24

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Shen Hui Wu, Sridhar Jandhyala, Yashwant K. Malaiya, Anura P. Jayasumana:
Antirandom Testing: A Distance-Based Approach. VLSI Design 2008: 165709:1-165709:9 (2008)

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