"Test intégré de processeur facilement testable. (Integrated ..."

Philippe de Choudens (1985)

> Home

Details and statistics

DOI: —

access: open

type: Book or Thesis

metadata version: 2020-07-21

- view
  - electronic edition @ archives-ouvertes.fr (open access)
- export record
  dblp key:
  - phd/hal/DeChoudens85
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/phd/hal/DeChoudens85
Philippe de Choudens:
Test intégré de processeur facilement testable. (Integrated test an easily testable processor). Grenoble Institute of Technology, France, 1985

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.