Stop the war!
Остановите войну!
for scientists:
default search action
"Modeling and simulation of hot-carrier induced device and circuit ..."
Yusuf Leblebici (1991)
- Yusuf Leblebici:
Modeling and simulation of hot-carrier induced device and circuit degradation for VLSI reliability. University of Illinois Urbana-Champaign, USA, 1991
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.