"ANN-Based Defects' Diagnosis of Industrial A Optical Devices."

Matthieu Voiry et al. (2009)

> Home

Details and statistics

DOI: —

access: closed

type: Reference Work

metadata version: 2017-06-08

- view
  - electronic edition @ igi-global.com
- export record
  dblp key:
  - reference/ai/VoiryABM09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/reference/ai/VoiryABM09
Matthieu Voiry, Véronique Amarger, Joël Bernier, Kurosh Madani:
ANN-Based Defects' Diagnosis of Industrial A Optical Devices. Encyclopedia of Artificial Intelligence 2009: 131-137

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.