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@inproceedings{DBLP:conf/itc/AbramoviciMH90,
author = {Miron Abramovici and
David T. Miller and
R. Henning},
title = {Global cost functions for test generation},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {35--43},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.113998},
doi = {10.1109/TEST.1990.113998},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbramoviciMH90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AcknerB90,
author = {Leslie Ackner and
Mark R. Barber},
title = {Frequency enhancement of digital {VLSI} test systems},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {444--451},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114053},
doi = {10.1109/TEST.1990.114053},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AcknerB90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalB90,
author = {Ajit Agrawal and
Debashis Bhattacharya},
title = {{CMP3F:} a high speed fault simulator for the Connection Machine},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {410--416},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114049},
doi = {10.1109/TEST.1990.114049},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgrawalB90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AkersPKS90,
author = {Sheldon B. Akers Jr. and
Sungju Park and
Balakrishnan Krishnamurthy and
Ashok Swaminathan},
title = {Why is less information from logic simulation more useful in fault
simulation?},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {786--800},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114096},
doi = {10.1109/TEST.1990.114096},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AkersPKS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Allen90,
author = {Don R. Allen},
title = {Failure probability algorithm for test systems to reduce false alarms},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {648--656},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114079},
doi = {10.1109/TEST.1990.114079},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Allen90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BakerV90,
author = {Keith Baker and
Bas Verhelst},
title = {I\({}_{\mbox{DDQ}}\) testing because 'zero defects isn't enough':
a Philips perspective},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {253--254},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114025},
doi = {10.1109/TEST.1990.114025},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BakerV90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bardell90,
author = {Paul H. Bardell},
title = {Analysis of cellular automata used as pseudorandom pattern generators},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {762--768},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114093},
doi = {10.1109/TEST.1990.114093},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bardell90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BishopGIGL90,
author = {Philip E. Bishop and
Grady Giles and
Sudarshan Iyengar and
C. Thomas Glover and
Wai{-}On Law},
title = {Testability considerations in the design of the {MC68340} Integrated
Processor Unit},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {337--346},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114040},
doi = {10.1109/TEST.1990.114040},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BishopGIGL90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BobbaS90,
author = {Ram Bobba and
B. Stevens},
title = {Fast embedded {A/D} converter testing using the microcontroller's
resources},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {598--604},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114073},
doi = {10.1109/TEST.1990.114073},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BobbaS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BonetGGGPY90,
author = {Luis A. Bonet and
J. Ganger and
Jim Girardeau and
Carlos Greaves and
M. Pendleton and
David Yatim},
title = {Test features of the {MC145472} {ISDN} U-transceivers},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {68--79},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114002},
doi = {10.1109/TEST.1990.114002},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BonetGGGPY90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Breuer90,
author = {Melvin A. Breuer},
title = {Obstacles and an approach towards concurrent engineering},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {260--261},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114029},
doi = {10.1109/TEST.1990.114029},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Breuer90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrynestadAV90,
author = {Ove Brynestad and
Einar J. Aas and
Anne E. Vallestad},
title = {State transition graph analysis as a key to {BIST} fault coverage},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {537--543},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114065},
doi = {10.1109/TEST.1990.114065},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrynestadAV90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Burlison90,
author = {Phil Burlison},
title = {Criteria for analyzing high frequency testing performance of {VLSI}
automatic test equipment},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {452--461},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114054},
doi = {10.1109/TEST.1990.114054},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Burlison90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CamuratiMPR90,
author = {Paolo Camurati and
Davide Medina and
Paolo Prinetto and
Matteo Sonza Reorda},
title = {A diagnostic test pattern generation algorithm},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {52--58},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114000},
doi = {10.1109/TEST.1990.114000},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CamuratiMPR90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CastrodaleDK90,
author = {Grant L. Castrodale and
Apostolos Dollas and
William T. Krakow},
title = {An interactive environment for the transparent logic simulation and
testing of integrated circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {394--403},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114047},
doi = {10.1109/TEST.1990.114047},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CastrodaleDK90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChanA90,
author = {John C. Chan and
Jacob A. Abraham},
title = {A study of faulty signatures using a matrix formulation},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {553--561},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114067},
doi = {10.1109/TEST.1990.114067},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChanA90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChandramouliGDG90,
author = {V. Chandramouli and
Ravi K. Gulati and
Ramaswami Dandapani and
Deepak K. Goel},
title = {Bridging faults and their implication to PLAs},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {852--859},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114103},
doi = {10.1109/TEST.1990.114103},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChandramouliGDG90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Chang90,
author = {J. Morris Chang},
title = {A study of the optimization of {DC} parametric tests},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {478--487},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114057},
doi = {10.1109/TEST.1990.114057},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Chang90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenLS90,
author = {Jwu E. Chen and
Chung{-}Len Lee and
Wen{-}Zen Shen},
title = {Single-fault fault collapsing analysis in sequential logic circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {809--814},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114098},
doi = {10.1109/TEST.1990.114098},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenLS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChengJ90,
author = {Kwang{-}Ting Cheng and
Jing{-}Yang Jou},
title = {Functional test generation for finite state machines},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {162--168},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114014},
doi = {10.1109/TEST.1990.114014},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChengJ90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChengLW90,
author = {Wu{-}Tung Cheng and
James L. Lewandowski and
Eleanor Wu},
title = {Diagnosis for wiring interconnects},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {565--571},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114069},
doi = {10.1109/TEST.1990.114069},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChengLW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChickermaneP90,
author = {Vivek Chickermane and
Janak H. Patel},
title = {An optimization based approach to the partial scan design problem},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {377--386},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114045},
doi = {10.1109/TEST.1990.114045},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChickermaneP90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Choi90,
author = {Chul J. Choi},
title = {Scan based guided probe technology delivers Cyclone to the market},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {115--119},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114008},
doi = {10.1109/TEST.1990.114008},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Choi90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Crook90,
author = {David T. Crook},
title = {A fourth generation analog incircuit program generator},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {605--612},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114074},
doi = {10.1109/TEST.1990.114074},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Crook90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DasSWAA90,
author = {Dharam Vir Das and
Sharad C. Seth and
Paul T. Wagner and
John C. Anderson and
Vishwani D. Agrawal},
title = {An experimental study on reject ratio prediction for {VLSI} circuits:
Kokomo revisited},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {712--720},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114087},
doi = {10.1109/TEST.1990.114087},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DasSWAA90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Dervisoglu90,
author = {Bulent I. Dervisoglu},
title = {Towards a standard approach for controlling board-level test functions},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {582--590},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114071},
doi = {10.1109/TEST.1990.114071},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Dervisoglu90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevadasK90,
author = {Srinivas Devadas and
Kurt Keutzer},
title = {Design of integrated circuits fully testable for delay-faults and
multifaults},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {284--293},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114034},
doi = {10.1109/TEST.1990.114034},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DevadasK90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Donlin90,
author = {Noel E. Donlin},
title = {{QML} (qualified manufacturing line): a method of providing high quality
integrated circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {262--263},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114030},
doi = {10.1109/TEST.1990.114030},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Donlin90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Elo90,
author = {Robert B. Elo},
title = {An empirical relationship between test transparency and fault coverage},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1006--1011},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114123},
doi = {10.1109/TEST.1990.114123},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Elo90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EmoriAMS90,
author = {Michiaki Emori and
Takashi Aikyo and
Yasuhide Machida and
Jun{-}ichi Shikatani},
title = {{ASIC} {CAD} system based on hierarchical design-for-testability},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {404--409},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114048},
doi = {10.1109/TEST.1990.114048},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EmoriAMS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FergusonTL90,
author = {F. Joel Ferguson and
Martin Taylor and
Tracy Larrabee},
title = {Testing for parametric faults in static {CMOS} circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {436--443},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114052},
doi = {10.1109/TEST.1990.114052},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FergusonTL90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FichtenbaumR90,
author = {Matthew L. Fichtenbaum and
Gordon D. Robinson},
title = {Scan test architectures for digital board testers},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {304--310},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114036},
doi = {10.1109/TEST.1990.114036},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FichtenbaumR90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FritzemeierSTH90,
author = {Ronald R. Fritzemeier and
Jerry M. Soden and
R. Keith Treece and
Charles F. Hawkins},
title = {Increased {CMOS} {IC} stuck-at fault coverage with reduced {I} \({}_{\mbox{DDQ}}\)
test sets},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {427--435},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114051},
doi = {10.1109/TEST.1990.114051},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FritzemeierSTH90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FurukawaKSKP90,
author = {Yasuo Furukawa and
Makoto Kimura and
Masao Sugai and
Shinichi Kimura and
Michael Purtell},
title = {Jitter minimization technique for mixed signal testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {613--619},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114075},
doi = {10.1109/TEST.1990.114075},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FurukawaKSKP90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GallupLMMSSS90,
author = {Michael G. Gallup and
William Ledbetter Jr. and
Ralph McGarity and
Steve McMahan and
Kenneth Scheuer and
Clark G. Shepard and
Lal Sood},
title = {Testability features of the 68040},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {749--757},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114091},
doi = {10.1109/TEST.1990.114091},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GallupLMMSSS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GartnerDFFKLORRW90,
author = {J. Gartner and
B. Driscoll and
Donato O. Forlenza and
Orazio P. Forlenza and
Timothy J. Koprowski and
T. Lizambri and
R. Olsen and
S. Robertson and
P. Ryan and
A. Walter},
title = {Weighted random test program generation for a per-pin tester},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1000--1005},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114122},
doi = {10.1109/TEST.1990.114122},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GartnerDFFKLORRW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GhoshDN90,
author = {Abhijit Ghosh and
Srinivas Devadas and
A. Richard Newton},
title = {Sequential logic synthesis for testability using register-transfer
level descriptions},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {274--283},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114033},
doi = {10.1109/TEST.1990.114033},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GhoshDN90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gill90,
author = {Durwin Gill},
title = {Time margin issues in disk drive testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {214--221},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114020},
doi = {10.1109/TEST.1990.114020},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gill90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Glover90,
author = {C. Thomas Glover},
title = {Mixed-mode {ATPG} under input constraints},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {142--151},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114012},
doi = {10.1109/TEST.1990.114012},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Glover90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GollakotaZ90,
author = {Naga Gollakota and
Ahmad Zaidi},
title = {Fault grading the Intel 80486},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {758--761},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114092},
doi = {10.1109/TEST.1990.114092},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GollakotaZ90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GundlachM90,
author = {Harald Gundlach and
Klaus D. M{\"{u}}ller{-}Glaser},
title = {On automatic testpoint insertion in sequential circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1072--1079},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114132},
doi = {10.1109/TEST.1990.114132},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GundlachM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HadeedL90,
author = {Yolanda T. Hadeed and
Kevin T. Lewis},
title = {The use of tolerance intervals in the characterization of semiconductor
devices},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {924--928},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114136},
doi = {10.1109/TEST.1990.114136},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HadeedL90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HandaS90,
author = {Masahiro Handa and
Russel L. Steinweg},
title = {Wave+: An easy-to-use vector generation language for compilers},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {994--999},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114121},
doi = {10.1109/TEST.1990.114121},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HandaS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandWH90,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Oliver F. Haberl},
title = {Generating pseudo-exhaustive vectors for external testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {670--679},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114082},
doi = {10.1109/TEST.1990.114082},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HellebrandWH90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hickling90,
author = {Robert L. Hickling},
title = {Extending binary searches to two and three dimensions {[IC} testing]},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {721--725},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114088},
doi = {10.1109/TEST.1990.114088},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Hickling90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuN90,
author = {Arthur Hu and
Hironobu Niijima},
title = {New approach to integrate {LSI} design databases with e-beam tester},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1040--1048},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114128},
doi = {10.1109/TEST.1990.114128},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuN90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuismanD90,
author = {Leendert M. Huisman and
Raja Daoud},
title = {Fault simulation of logic designs on parallel processors with distributed
memory},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {690--697},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114084},
doi = {10.1109/TEST.1990.114084},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuismanD90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ImmaneniR90,
author = {Venkata R. Immaneni and
Srinivas Raman},
title = {Direct access test scheme-design of block and core cells for embedded
ASICs},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {488--492},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114058},
doi = {10.1109/TEST.1990.114058},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ImmaneniR90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IwasakiY90,
author = {Kazuhiko Iwasaki and
Noboru Yamaguchi},
title = {Design of signature circuits based on weight distributions of error-correcting
codes},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {779--785},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114095},
doi = {10.1109/TEST.1990.114095},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IwasakiY90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jong90,
author = {Frans G. M. de Jong},
title = {Boundary scan test used at board level: moving towards reality},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {235--242},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114022},
doi = {10.1109/TEST.1990.114022},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Jong90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KarpovskyLV90,
author = {Mark G. Karpovsky and
Lev B. Levitin and
Feodor S. Vainstein},
title = {Identification of faulty processing elements by space-time compression
of test responses},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {638--647},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114078},
doi = {10.1109/TEST.1990.114078},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KarpovskyLV90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kato90,
author = {Haruo Kato},
title = {Color reproduction test for {CCD} image sensors},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {493--497},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114059},
doi = {10.1109/TEST.1990.114059},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kato90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Keezer90,
author = {David C. Keezer},
title = {Multiplexing test system channels for data rates above 1 Gb/s},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {362--368},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114043},
doi = {10.1109/TEST.1990.114043},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Keezer90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KleinB90,
author = {Larry Klein and
John Bridgeman},
title = {An architecture for high-speed analog in-circuit testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {562--564},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114068},
doi = {10.1109/TEST.1990.114068},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KleinB90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KoikeTT90,
author = {Hiroki Koike and
Toshio Takeshima and
Masahide Takada},
title = {A {BIST} scheme using microprogram {ROM} for large capacity memories},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {815--822},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114099},
doi = {10.1109/TEST.1990.114099},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KoikeTT90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuS90,
author = {Tsu{-}Wei Ku and
Mani Soma},
title = {Minimal overhead modification of iterative logic arrays for C-testability},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {964--969},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114117},
doi = {10.1109/TEST.1990.114117},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KujiM90,
author = {Norio Kuji and
Kiyoshi Matsumoto},
title = {Marginal fault diagnosis based on e-beam static fault imaging with
{CAD} interface},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1049--1054},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114129},
doi = {10.1109/TEST.1990.114129},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KujiM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuritaKH90,
author = {Jun Kurita and
Nobuyuki Kasuga and
Kiyoyasu Hiwada},
title = {An advanced test system architecture for synchronous and asynchronous
control of mixed signal device testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {508--513},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114061},
doi = {10.1109/TEST.1990.114061},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuritaKH90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LandisS90,
author = {David L. Landis and
Padmaraj Singh},
title = {Optimal placement of {IEEE} 1149.1 test port and boundary scan resources
for wafer scale integration},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {120--126},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114009},
doi = {10.1109/TEST.1990.114009},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LandisS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LangleyRP90,
author = {Frank J. Langley and
C. A. Robinson and
R. A. Passero},
title = {Automatic electro-optical testing of automobile dashboard displays
in a factory environment},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {208--213},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114019},
doi = {10.1109/TEST.1990.114019},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LangleyRP90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lanier90,
author = {Kenneth Lanier},
title = {ATE-based functional {ISDN} testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {86--94},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114004},
doi = {10.1109/TEST.1990.114004},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lanier90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeB90,
author = {Kuen{-}Jong Lee and
Melvin A. Breuer},
title = {On the charge sharing problem in {CMOS} stuck-open fault testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {417--426},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114050},
doi = {10.1109/TEST.1990.114050},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeB90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeenstraS90,
author = {Jens Leenstra and
Lambert Spaanenburg},
title = {Hierarchical test assembly for macro based {VLSI} design},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {520--529},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114063},
doi = {10.1109/TEST.1990.114063},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeenstraS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lefebvre90,
author = {Mark F. Lefebvre},
title = {Functional test and diagnosis: a proposed {JTAG} sample mode scan
tester},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {294--303},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114035},
doi = {10.1109/TEST.1990.114035},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lefebvre90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LowensteinSW90,
author = {Al Lowenstein and
Steve Schlosser and
Greg Winter},
title = {Concurrent engineering},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {258--259},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114028},
doi = {10.1109/TEST.1990.114028},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LowensteinSW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaamariR90,
author = {Fadi Maamari and
Janusz Rajski},
title = {The dynamic reduction of fault simulation},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {801--808},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114097},
doi = {10.1109/TEST.1990.114097},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaamariR90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maierhofer90,
author = {Johann Maierhofer},
title = {Hierarchical self-test concept based on the {JTAG} standard},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {127--134},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114010},
doi = {10.1109/TEST.1990.114010},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maierhofer90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MakkiP90,
author = {Rafic Z. Makki and
Krisbnm Palaniswami},
title = {Practical partitioning for testability with time-shared boundary scan},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {970--977},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114118},
doi = {10.1109/TEST.1990.114118},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MakkiP90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalekO90,
author = {Miroslaw Malek and
Banu {\"{O}}zden},
title = {Optimized testing of meshes},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {627--637},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114077},
doi = {10.1109/TEST.1990.114077},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MalekO90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maly90,
author = {Wojciech Maly},
title = {Current testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {257},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114027},
doi = {10.1109/TEST.1990.114027},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maly90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaoC90,
author = {Weiwei Mao and
Michael D. Ciletti},
title = {Arrangement of latches in scan-path design to improve delay fault
coverage},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {387--393},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114046},
doi = {10.1109/TEST.1990.114046},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaoC90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MastorisN90,
author = {Y. M. Mastoris and
P. D. Nash},
title = {Networking verification process and environments: an extension of
the product realization process for new network capabilities},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {620--626},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114076},
doi = {10.1109/TEST.1990.114076},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MastorisN90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MazumderY90,
author = {Pinaki Mazumder and
Jih{-}Shyr Yih},
title = {A novel built-in self-repair approach to {VLSI} memory yield enhancement},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {833--841},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114101},
doi = {10.1109/TEST.1990.114101},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MazumderY90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McEuen90,
author = {Steven D. McEuen},
title = {Why, I\({}_{\mbox{DDQ}}\)? {[CMOS} {IC} testing]},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {252},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114024},
doi = {10.1109/TEST.1990.114024},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McEuen90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MeershoekVMT90,
author = {R. Meershoek and
Bas Verhelst and
Rory McInerney and
Loek Thijssen},
title = {Functional and I\({}_{\mbox{DDQ}}\) testing on a static {RAM}},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {929--937},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114113},
doi = {10.1109/TEST.1990.114113},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MeershoekVMT90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MehtaniBHHB90,
author = {R. Mehtani and
Keith Baker and
C. M. Huizer and
P. J. Hynes and
Jos van Beers},
title = {Macro-testability and the {VSP}},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {739--748},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114090},
doi = {10.1109/TEST.1990.114090},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MehtaniBHHB90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MenozziLSR90,
author = {Roberto Menozzi and
Massimo Lanzoni and
Luca Selmi and
Bruno Ricc{\`{o}}},
title = {An improved procedure to test {CMOS} ICs for latch-up},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1028--1034},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114126},
doi = {10.1109/TEST.1990.114126},
timestamp = {Wed, 03 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MenozziLSR90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MielkeP90,
author = {Joseph A. Mielke and
Keith A. Pope},
title = {High-speed fixture interconnects for mixed-signal {IC} testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {891--895},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114108},
doi = {10.1109/TEST.1990.114108},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MielkeP90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MillmanMA90,
author = {Steven D. Millman and
Edward J. McCluskey and
John M. Acken},
title = {Diagnosing {CMOS} bridging faults with stuck-at fault dictionaries},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {860--870},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114104},
doi = {10.1109/TEST.1990.114104},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MillmanMA90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoranHBG90,
author = {Larry Moran and
Robert Hillman and
Phil Burlison and
Tom Gurda},
title = {The Waveform and Vector Exchange Specification {(WAVES)}},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {978--987},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114119},
doi = {10.1109/TEST.1990.114119},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MoranHBG90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mullenix90,
author = {Paul Mullenix},
title = {The capability of capability indices with an application to guardbanding
in a test environment},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {907--915},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114111},
doi = {10.1109/TEST.1990.114111},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Mullenix90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MuradaliAN90,
author = {Fidel Muradali and
Vinod K. Agarwal and
Benoit Nadeau{-}Dostie},
title = {A new procedure for weighted random built-in self-test},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {660--669},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114081},
doi = {10.1109/TEST.1990.114081},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MuradaliAN90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Muris90,
author = {Math Muris},
title = {Integrating boundary scan test into an {ASIC} design flow},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {472--477},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114056},
doi = {10.1109/TEST.1990.114056},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Muris90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MurrayN90,
author = {Donald F. Murray and
C. Michael Nash},
title = {Critical parameters for high-performance dynamic response measurements},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {462--471},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114055},
doi = {10.1109/TEST.1990.114055},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MurrayN90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NichollsNS90,
author = {William H. Nicholls and
Arnold W. Nordsieck and
Mani Soma},
title = {Experimental evaluation of concurrent fault simulation algorithms
on scalable, hierarchically defined test cases},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {698--705},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114085},
doi = {10.1109/TEST.1990.114085},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NichollsNS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nicolaidis90,
author = {Michael Nicolaidis},
title = {Efficient {UBIST} implementation for microprocessor sequencing parts},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {316--326},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114038},
doi = {10.1109/TEST.1990.114038},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nicolaidis90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nozuyama90,
author = {Yasuyuki Nozuyama},
title = {Realization of an efficient design verification test used on a microinstruction
controlled self test},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {327--336},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114039},
doi = {10.1109/TEST.1990.114039},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nozuyama90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OgiharaKYK90,
author = {Takuji Ogihara and
Yasushi Koseko and
Genichi Yonemori and
Hiroyuki Kawai},
title = {Testable design and support tool for cell based test},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1065--1071},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114131},
doi = {10.1109/TEST.1990.114131},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OgiharaKYK90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Oka90,
author = {David K. Oka},
title = {Analog test requirements of linear echo cancellation {ISDN} devices},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {59--67},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114001},
doi = {10.1109/TEST.1990.114001},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Oka90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Organ90,
author = {Don Organ},
title = {enVision: the inside story},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {530--536},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114064},
doi = {10.1109/TEST.1990.114064},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Organ90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Palumbo90,
author = {Michael P. Palumbo},
title = {Technique for transfer of analog prototypes (DV's) to production},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {916--923},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114112},
doi = {10.1109/TEST.1990.114112},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Palumbo90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PancholyRM90,
author = {Ashish Pancholy and
Janusz Rajski and
Larry J. McNaughton},
title = {Empirical failure analysis and validation of fault models in {CMOS}
{VLSI}},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {938--947},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114114},
doi = {10.1109/TEST.1990.114114},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PancholyRM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParkM90,
author = {Bong{-}Hee Park and
Premachandran R. Menon},
title = {Design of scan-testable {CMOS} sequential circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {369--376},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114044},
doi = {10.1109/TEST.1990.114044},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParkM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParkerO90,
author = {Kenneth P. Parker and
Stig Oresjo},
title = {A language for describing boundary-scan devices},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {222--234},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114021},
doi = {10.1109/TEST.1990.114021},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParkerO90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiC90,
author = {Janusz Rajski and
Henry Cox},
title = {A method to calculate necessary assignments in algorithmic test pattern
generation},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {25--34},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.113997},
doi = {10.1109/TEST.1990.113997},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiC90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiV90,
author = {Janusz Rajski and
Jagadeesh Vasudevamurthy},
title = {Testability preserving transformations in multi-level logic synthesis},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {265--273},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114032},
doi = {10.1109/TEST.1990.114032},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiV90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RastogiS90,
author = {Ravi Rastogi and
Kenneth F. Sierzega},
title = {A new approach to mixed-signal diagnosis},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {591--597},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114072},
doi = {10.1109/TEST.1990.114072},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RastogiS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RijsingeHVW90,
author = {Robert Van Rijsinge and
A. A. R. M. Haggenburg and
C. de Vries and
Hans Wallinga},
title = {From specification to measurement: the bottleneck in analog industrial
testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {177--182},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114016},
doi = {10.1109/TEST.1990.114016},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RijsingeHVW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RobinsonD90,
author = {Gordon D. Robinson and
John G. Deshayes},
title = {Interconnect testing of boards with partial boundary scan},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {572--581},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114070},
doi = {10.1109/TEST.1990.114070},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RobinsonD90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SakashitaSTFKST90,
author = {Narumi Sakashita and
Hisako Sawai and
Eiichi Teraoka and
Toshiki Fugiyama and
Toru Kengaku and
Yukihiko Shimazu and
Takeshi Tokuda},
title = {Built-in self-test in a 24 bit floating point digital signal processor},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {880--885},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114106},
doi = {10.1109/TEST.1990.114106},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SakashitaSTFKST90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sapp90,
author = {Gordon Sapp},
title = {{ASSIST} (Allied Signal's Standardized Integrated Scan Test)},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {95--102},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114005},
doi = {10.1109/TEST.1990.114005},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sapp90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SarkanyL90,
author = {Endre F. Sarkany and
Robert F. Lusch},
title = {Innovative techniques for improved testability},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {103--108},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114006},
doi = {10.1109/TEST.1990.114006},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SarkanyL90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SasCM90,
author = {Jos van Sas and
Francky Catthoor and
Hugo De Man},
title = {Cellular automata based self-test for programmable data paths},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {769--778},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114094},
doi = {10.1109/TEST.1990.114094},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SasCM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Savir90,
author = {Jacob Savir},
title = {{AC} product defect level and yield loss},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {726--738},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114089},
doi = {10.1109/TEST.1990.114089},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Savir90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SavirM90,
author = {Jacob Savir and
William H. McAnney},
title = {A multiple seed linear feedback shift register},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {657--659},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114080},
doi = {10.1109/TEST.1990.114080},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SavirM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Schleifer90,
author = {Samuel Schleifer},
title = {Improving wafer sort yields with radius-tip probes},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {896--899},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114109},
doi = {10.1109/TEST.1990.114109},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Schleifer90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchwairR90,
author = {Thomas M. Schwair and
Hartmut C. Ritter},
title = {Complete self-test architecture for a coprocessor [cryptography]},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {886--890},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114107},
doi = {10.1109/TEST.1990.114107},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SchwairR90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SebestaVW90,
author = {William W. Sebesta and
Bas Verhelst and
Michael G. Wahl},
title = {Development of a new standard for test},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {988--993},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114120},
doi = {10.1109/TEST.1990.114120},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SebestaVW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShinagawaN90,
author = {Mitsuru Shinagawa and
Tadao Nagatsuma},
title = {A picosecond external electro-optic prober using laser diodes},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1035--1039},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114127},
doi = {10.1109/TEST.1990.114127},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShinagawaN90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SicardK90,
author = {Etienne Sicard and
Kozo Kinoshita},
title = {On the evaluation of process-fault tolerance ability of {CMOS} integrated
circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {948--954},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114115},
doi = {10.1109/TEST.1990.114115},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SicardK90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SodenFH90,
author = {Jerry M. Soden and
Ronald R. Fritzemeier and
Charles F. Hawkins},
title = {Zero defects or zero stuck-at faults-CMOS {IC} process improvement
with I\({}_{\mbox{DDQ}}\)},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {255--256},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114026},
doi = {10.1109/TEST.1990.114026},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SodenFH90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Soma90,
author = {Mani Soma},
title = {A design-for-test methodology for active analog filters},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {183--192},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114017},
doi = {10.1109/TEST.1990.114017},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Soma90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SongM90,
author = {Ohyoung Song and
Premachandran R. Menon},
title = {Parallel pattern fault simulation based on stem faults in combinational
circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {706--711},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114086},
doi = {10.1109/TEST.1990.114086},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SongM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SoudersS90,
author = {T. Michael Souders and
Gerard N. Stenbakken},
title = {A comprehensive approach for modeling and testing analog and mixed-signal
devices},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {169--176},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114015},
doi = {10.1109/TEST.1990.114015},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SoudersS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sprinkle90,
author = {Billy W. Sprinkle},
title = {Fast and accurate testing of {ISDN} {S/T} interface devices using
pseudo error rate techniques},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {80--85},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114003},
doi = {10.1109/TEST.1990.114003},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sprinkle90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SterbaHM90,
author = {Don Sterba and
Andy Halliday and
Don McClean},
title = {{ATPG} issues for board designs implementing boundary scan},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {243--251},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114023},
doi = {10.1109/TEST.1990.114023},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SterbaHM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StoreyM90a,
author = {Thomas M. Storey and
Wojciech Maly},
title = {{CMOS} bridging fault detection},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {842--851},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114102},
doi = {10.1109/TEST.1990.114102},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StoreyM90a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StroeleW90,
author = {Albrecht P. Stroele and
Hans{-}Joachim Wunderlich},
title = {Error masking in self-testable circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {544--552},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114066},
doi = {10.1109/TEST.1990.114066},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StroeleW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuK90,
author = {Chau{-}Chin Su and
Charles R. Kime},
title = {Multiple path sensitization for hierarchical circuit testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {152--161},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114013},
doi = {10.1109/TEST.1990.114013},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuK90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuK90a,
author = {Chau{-}Chin Su and
Charles R. Kime},
title = {Computer-aided design of pseudoexhaustive {BIST} for semiregular circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {680--689},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114083},
doi = {10.1109/TEST.1990.114083},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuK90a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sweeney90,
author = {John Sweeney},
title = {Testability implemented in the {VAX} 6000 model 400},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {109--114},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114007},
doi = {10.1109/TEST.1990.114007},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sweeney90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TadaTNHASU90,
author = {T. Tada and
R. Takagi and
S. Nakao and
M. Hyozo and
T. Arakawa and
K. Sawada and
M. Ueda},
title = {A fine pitch probe technology for {VLSI} wafer testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {900--906},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114110},
doi = {10.1109/TEST.1990.114110},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TadaTNHASU90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Taylor90,
author = {Anthony Taylor},
title = {An analysis of {ATE} computational architecture},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {514--519},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114062},
doi = {10.1109/TEST.1990.114062},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Taylor90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Thomas90,
author = {Robert W. Thomas},
title = {Test engineers role in {QML}},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {264},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114031},
doi = {10.1109/TEST.1990.114031},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Thomas90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsaiL90,
author = {Sheng{-}Jen Tsai and
Wha{-}Joon Lee},
title = {A high-speed pin-memory architecture using multiport dynamic RAMs},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {347--354},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114041},
doi = {10.1109/TEST.1990.114041},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsaiL90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Varma90,
author = {Prab Varma},
title = {TDRC-a symbolic simulation based design for testability rules checker},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1055--1064},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114130},
doi = {10.1109/TEST.1990.114130},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Varma90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VelazcoBM90,
author = {Raoul Velazco and
Catherine Bellon and
Bernard Martinet},
title = {Failure coverage of functional test methods: a comparative experimental
evaluation},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1012--1017},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114124},
doi = {10.1109/TEST.1990.114124},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VelazcoBM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ViacrozeL90,
author = {Thierry Viacroze and
Marc Lequeux},
title = {Analysis of failures on memories using expert system techniques},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {823--832},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114100},
doi = {10.1109/TEST.1990.114100},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ViacrozeL90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WaicukauskiSGM90,
author = {John A. Waicukauski and
Paul A. Shupe and
David Giramma and
Arshad Matin},
title = {{ATPG} for ultra-large structured designs},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {44--51},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.113999},
doi = {10.1109/TEST.1990.113999},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WaicukauskiSGM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Walker90,
author = {Alan C. Walker},
title = {Stress profile derivation-an empirical approach},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {193--207},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114018},
doi = {10.1109/TEST.1990.114018},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Walker90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WeimerBFL90,
author = {Jack Weimer and
Kevin Baade and
John Fitzsimmons and
Brian Lowe},
title = {A rapid dither algorithm advances {A/D} converter testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {498--507},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114060},
doi = {10.1109/TEST.1990.114060},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WeimerBFL90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WenK90,
author = {Xiaoqing Wen and
Kozo Kinoshita},
title = {A testable design of logic circuits under highly observable condition},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {955--963},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114116},
doi = {10.1109/TEST.1990.114116},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WenK90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WestN90,
author = {Burnell West and
Tom Napier},
title = {Sequencer Per Pin test system architecture},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {355--361},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114042},
doi = {10.1109/TEST.1990.114042},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WestN90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Whetsel90,
author = {Lee Whetsel},
title = {Event qualification: a gateway to at-speed system testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {135--141},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114011},
doi = {10.1109/TEST.1990.114011},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Whetsel90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WilliamsH90,
author = {Richard H. Williams and
Charles F. Hawkins},
title = {Errors in testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {1018--1027},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114125},
doi = {10.1109/TEST.1990.114125},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WilliamsH90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Yamada90,
author = {Akihiko Yamada},
title = {Challenge of design and test of ultra-large-scale circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {23},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.113996},
doi = {10.1109/TEST.1990.113996},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Yamada90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YauJ90,
author = {Chi W. Yau and
Najmi T. Jarwala},
title = {The boundary-scan master: target applications and functional requirements},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {311--315},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114037},
doi = {10.1109/TEST.1990.114037},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YauJ90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZorianI90,
author = {Yervant Zorian and
Andr{\'{e}} Ivanov},
title = {{EEODM:} An effective {BIST} scheme for ROMs},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {871--879},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114105},
doi = {10.1109/TEST.1990.114105},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZorianI90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1990,
title = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://ieeexplore.ieee.org/xpl/conhome/485/proceeding},
isbn = {0-8186-9064-X},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/1990.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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