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export results for "Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path Delay Tests."

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@article{DBLP:journals/dt/ShahNS20,
  author       = {Ankit Shah and
                  Raman Nayyar and
                  Arani Sinha},
  title        = {Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust
                  Path Delay Tests},
  journal      = {{IEEE} Des. Test},
  volume       = {37},
  number       = {4},
  pages        = {7--13},
  year         = {2020},
  url          = {https://doi.org/10.1109/MDAT.2020.2968253},
  doi          = {10.1109/MDAT.2020.2968253},
  timestamp    = {Mon, 28 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/ShahNS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ShahNS19,
  author       = {Ankit Shah and
                  Raman Nayyar and
                  Arani Sinha},
  title        = {Silicon Proven Timing Signoff Methodology using Hazard-Free Robust
                  Path Delay Tests},
  booktitle    = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
                  April 23-25, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/VTS.2019.8758603},
  doi          = {10.1109/VTS.2019.8758603},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/ShahNS19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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