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export results for "Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path Delay Tests."
@article{DBLP:journals/dt/ShahNS20, author = {Ankit Shah and Raman Nayyar and Arani Sinha}, title = {Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path Delay Tests}, journal = {{IEEE} Des. Test}, volume = {37}, number = {4}, pages = {7--13}, year = {2020}, url = {https://doi.org/10.1109/MDAT.2020.2968253}, doi = {10.1109/MDAT.2020.2968253}, timestamp = {Mon, 28 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/ShahNS20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/ShahNS19, author = {Ankit Shah and Raman Nayyar and Arani Sinha}, title = {Silicon Proven Timing Signoff Methodology using Hazard-Free Robust Path Delay Tests}, booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA, April 23-25, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/VTS.2019.8758603}, doi = {10.1109/VTS.2019.8758603}, timestamp = {Wed, 16 Oct 2019 14:14:54 +0200}, biburl = {https://dblp.org/rec/conf/vts/ShahNS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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