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Publication search results
found 9 matches
- 2012
- E. Henes Neto, R. Soares, E. Conrad, J. Costa, M. Ramaswami:
A semi-passive UHF RFID tag compliant with Brazilian National Automated Vehicle Identification System (SINIAV). RFID-TA 2012: 117-121 - 2008
- Egas Henes Neto, Gilson I. Wirth, Fernanda Lima Kastensmidt:
Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors. J. Electron. Test. 24(5): 425-437 (2008) - Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt:
Modeling the sensitivity of CMOS circuits to radiation induced single event transients. Microelectron. Reliab. 48(1): 29-36 (2008) - 2007
- Carlos Arthur Lang Lisbôa, Fernanda Lima Kastensmidt, Egas Henes Neto, Gilson I. Wirth, Luigi Carro:
Using built-in sensors to cope with long duration transient faults in future technologies. ITC 2007: 1-10 - Egas Henes Neto, Fernanda Lima Kastensmidt, Gilson I. Wirth:
A built-in current sensor for high speed soft errors detection robust to process and temperature variations. SBCCI 2007: 190-195 - 2006
- Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt:
Using Bulk Built-in Current Sensors to Detect Soft Errors. IEEE Micro 26(5): 10-18 (2006) - Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt:
Generation and Propagation of Single Event Transients in CMOS Circuits. DDECS 2006: 198-203 - 2005
- Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt:
Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. SBCCI 2005: 62-67 - Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt:
Single event transients in combinatorial circuits. SBCCI 2005: 121-126
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