• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 19 matches

• 2010
• 
  Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam:
  Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. J. Electron. Test. 26(4): 405-417 (2010)
• 2006
• 
  Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal:
  DIBPro: Automatic Diagnostic Program Generation Tool. ITC 2006: 1-8
• 2005
• 
  Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee:
  Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. ETS 2005: 68-73
• 2004
• 
  John M. Hitchcock, Aduri Pavan, Pramodchandran N. Variyam:
  Partial Bi-Immunity and NP-Completeness. Electron. Colloquium Comput. Complex. TR04 (2004)
• 2003
• 
  Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam:
  Automatic Diagnostic Program Generation for Mixed Signal Load Board. ITC 2003: 403-409
• 2002
• 
  Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee:
  Prediction of analog performance parameters using fast transienttesting. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(3): 349-361 (2002)
• 
  Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley:
  Measuring Stray Capacitance on Tester Hardware. VTS 2002: 351-356
• 2000
• 
  Pramodchandran N. Variyam, Abhijit Chatterjee:
  Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. IEEE Des. Test Comput. 17(3): 106-115 (2000)
• 
  Pramodchandran N. Variyam, Abhijit Chatterjee:
  Specification-driven test generation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(10): 1189-1201 (2000)
• 
  Pramodchandran N. Variyam:
  Increasing the IDDQ test resolution using current prediction. ITC 2000: 217-224
• 
  Pramodchandran N. Variyam, Vinay Agrawal:
  Measuring code edges of ADCs using interpolation and its application to offset and gain error testing. ITC 2000: 349-357
• 1999
• 
  Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee:
  Test Generation for Analog Circuits Using Partial Numerical Simulation. VLSI Design 1999: 597-602
• 
  Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee:
  Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation. VTS 1999: 214-219
• 1998
• 
  Pramodchandran N. Variyam, Abhijit Chatterjee:
  Specification-Driven Test Design for Analog Circuits. DFT 1998: 335-340
• 
  Pramodchandran N. Variyam, Abhijit Chatterjee:
  Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements. VTS 1998: 132-137
• 
  Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi:
  Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. VTS 1998: 145-151
• 1997
• 
  Pramodchandran N. Variyam, Abhijit Chatterjee:
  Test generation for comprehensive testing of linear analog circuits using transient response sampling. ICCAD 1997: 382-385
• 
  Pramodchandran N. Variyam, Abhijit Chatterjee:
  FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation. VLSI Design 1997: 408-412
• 
  Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi:
  Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. VTS 1997: 261-266