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Publication search results
found 31 matches
- 2008
- Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire:
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS 2008: 47-52 - Simone Alpe, Stefano Di Carlo, Paolo Prinetto, Alessandro Savino:
Applying March Tests to K-Way Set-Associative Cache Memories. ETS 2008: 77-83 - Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso:
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. ETS 2008: 140-145 - Swapnil Bahl, Vishal Srivastava:
Self-Programmable Shared BIST for Testing Multiple Memories. ETS 2008: 91-96 - Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens:
Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism. ETS 2008: 21-26 - Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker:
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ETS 2008: 113-118 - Ehab Anis Daoud, Nicola Nicolici:
On Bypassing Blocking Bugs during Post-Silicon Validation. ETS 2008: 69-74 - Qingqi Dou, Jacob A. Abraham:
Jitter Decomposition in High-Speed Communication Systems. ETS 2008: 157-162 - Laura Frigerio, Matteo Alan Radaelli, Fabio Salice:
Convolutional Coding for SEU mitigation. ETS 2008: 191-196 - Benoît Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli:
Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories. ETS 2008: 84-90 - Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
Accelerated Shift Registers for X-tolerant Test Data Compaction. ETS 2008: 133-139 - Stefan Holst, Hans-Joachim Wunderlich:
Adaptive Debug and Diagnosis without Fault Dictionaries. ETS 2008: 199-204 - Yu Huang, Wu-Tung Cheng, Ruifeng Guo:
Diagnose Multiple Stuck-at Scan Chain Faults. ETS 2008: 105-110 - Maksim Jenihhin, Jaan Raik, Anton Chepurov, Raimund Ubar:
Temporally Extended High-Level Decision Diagrams for PSL Assertions Simulation. ETS 2008: 61-68 - S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod:
Bridge Defect Diagnosis for Multiple-Voltage Design. ETS 2008: 99-104 - Esa Korhonen, Juha Kostamovaara:
An Improved Algorithm to Identify the Test Stimulus in Histogram-Based A/D Converter Testing. ETS 2008: 149-154 - Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris:
Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. ETS 2008: 35-40 - Cecilia Metra, Daniele Rossi, Martin Omaña, Abhijit Jas, Rajesh Galivanche:
Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic. ETS 2008: 171-176 - Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
A Reliable Architecture for the Advanced Encryption Standard. ETS 2008: 13-18 - Irith Pomeranz, Sudhakar M. Reddy:
Safe Fault Collapsing Based on Dominance Relations. ETS 2008: 7-12 - Daniele Rossi, Paolo Angelini, Cecilia Metra, Giovanni Campardo, Gian Pietro Vanalli:
Risks for Signal Integrity in System in Package and Possible Remedies. ETS 2008: 165-170 - Antonio Rubio:
The Role of Test in Circuits Built with Unreliable Components. ETS 2008: 3 - Rajarajan Senguttuvan, Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee:
Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters. ETS 2008: 41-46 - Rajeshwary Tayade, Jacob A. Abraham:
Critical Path Selection for Delay Test Considering Coupling Noise. ETS 2008: 119-124 - Seongmoon Wang, Wenlong Wei:
Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. ETS 2008: 125-130 - Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja:
A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. ETS 2008: 55-60 - Thomas W. Williams:
The Future Is Low Power and Test. ETS 2008: 4 - Quming Zhou, Mihir R. Choudhury, Kartik Mohanram:
Tunable Transient Filters for Soft Error Rate Reduction in Combinational Circuits. ETS 2008: 179-184 - Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong:
Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. ETS 2008: 27-32 - Christian G. Zoellin, Hans-Joachim Wunderlich, Ilia Polian, Bernd Becker:
Selective Hardening in Early Design Steps. ETS 2008: 185-190
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