"Non-Scan Design-for-Testability Techniques for Sequential Circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Vivek Chickermane et al. (1993)

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DOI: 10.1145/157485.164686

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Vivek Chickermane, Elizabeth M. Rudnick, Prithviraj Banerjee, Janak H. Patel:
Non-Scan Design-for-Testability Techniques for Sequential Circuits. DAC 1993: 236-241

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