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Moritz Fieback
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- affiliation: Delft University of Technology, Netherlands
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2020 – today
- 2024
- [j6]Thiago Santos Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls:
A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing. J. Electron. Test. 40(2): 245-257 (2024) - [c36]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Diagnosis for Yield Learning in RRAMs. DATE 2024: 1-6 - [c35]Moritz Fieback, Letícia Maria Veiras Bolzani Poehls:
Lifecycle Management of Emerging Memories. ETS 2024: 1-6 - [c34]Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Online Detection of Unique Faults in RRAMs. ETS 2024: 1-2 - [c33]Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Design-for-Test for Intermittent Faults in STT-MRAMs. ETS 2024: 1-6 - [c32]Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe:
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. LATS 2024: 1-5 - [c31]Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani:
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. LATS 2024: 1-6 - 2023
- [c30]Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Device Aware Diagnosis for Unique Defects in STT-MRAMs. ATS 2023: 1-6 - [c29]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui:
Characterization and Test of Intermittent Over RESET in RRAMs. ATS 2023: 1-6 - [c28]Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui:
Device-Aware Test for Back-Hopping Defects in STT-MRAMs. DATE 2023: 1-6 - [c27]Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui:
Online Fault Detection and Diagnosis in RRAM. ETS 2023: 1-6 - [c26]Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui:
Dependability of Future Edge-AI Processors: Pandora's Box. ETS 2023: 1-6 - [c25]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui:
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. ETS 2023: 1-6 - [c24]Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. ITC 2023: 236-245 - [c23]Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test for Ion Depletion Defects in RRAMs. ITC 2023: 246-255 - 2022
- [j5]Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui:
Defects, Fault Modeling, and Test Development Framework for RRAMs. ACM J. Emerg. Technol. Comput. Syst. 18(3): 52:1-52:26 (2022) - [c22]Troya Çagil Köylü, Moritz Fieback, Said Hamdioui, Mottaqiallah Taouil:
Using Hopfield Networks to Correct Instruction Faults. ATS 2022: 102-107 - [c21]Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori:
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. ETS 2022: 1-6 - [c20]Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui:
Hierarchical Memory Diagnosis. ETS 2022: 1-2 - [c19]Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu:
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS 2022: 1-10 - [c18]Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui:
Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. ITC 2022: 400-409 - [c17]Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Structured Test Development Approach for Computation-in-Memory Architectures. ITC-Asia 2022: 61-66 - [c16]Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls:
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. LATS 2022: 1-6 - 2021
- [j4]Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke:
Review of Manufacturing Process Defects and Their Effects on Memristive Devices. J. Electron. Test. 37(4): 427-437 (2021) - [j3]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerg. Top. Comput. 9(2): 707-723 (2021) - [j2]Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui:
Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 29(6): 1271-1284 (2021) - [c15]Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau:
Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. DATE 2021: 1877-1880 - [c14]G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui:
Improving the Detection of Undefined State Faults in FinFET SRAMs. DTIS 2021: 1-6 - [c13]Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Intermittent Undefined State Fault in RRAMs. ETS 2021: 1-6 - [c12]G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui:
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. ETS 2021: 1-6 - [c11]E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani:
Evaluating the Impact of Process Variation on RRAMs. LATS 2021: 1-6 - 2020
- [j1]Hassen Aziza, Mathieu Moreau, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). IEEE Access 8: 137263-137274 (2020) - [c10]Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui:
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE 2020: 792-797 - [c9]Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui:
Testing Scouting Logic-Based Computation-in-Memory Architectures. ETS 2020: 1-6 - [c8]Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. ETS 2020: 1-2 - [c7]Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui:
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. VTS 2020: 1-10
2010 – 2019
- 2019
- [c6]Alberto Bosio, Ian O'Connor, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Elena I. Vatajelu, Giorgio Di Natale, Lorena Anghel, Surya Nagarajan, Moritz Fieback, Said Hamdioui:
Rebooting Computing: The Challenges for Test and Reliability. DFT 2019: 8138-8143 - [c5]Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui:
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. ETS 2019: 1-2 - [c4]Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test: A New Test Approach Towards DPPB Level. ITC 2019: 1-10 - [c3]Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil:
Testing Computation-in-Memory Architectures Based on Emerging Memories. ITC 2019: 1-10 - 2018
- [c2]Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Testing Resistive Memories: Where are We and What is Missing? ITC 2018: 1-9 - [c1]Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Marco Rovatti:
Ionizing radiation modeling in DRAM transistors. LATS 2018: 1-6
Coauthor Index
aka: Letícia Maria Veiras Bolzani Poehls
aka: Letícia Maria Bolzani Poehls
aka: Leticia B. Poehls
aka: Leticia Bolzani Poehls
aka: Guilherme Cardoso Medeiros
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last updated on 2024-10-23 20:34 CEST by the dblp team
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