Kris Croes

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Gerald Beyer

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Publications

2018
[c16]
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  dblp key:
  - conf/irps/LiSHPBBC18
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  persistent URL:
  - https://dblp.org/rec/conf/irps/LiSHPBBC18
Yunlong Li, Michele Stucchi, Stefaan Van Huylenbroeck, Geert Van der Plas, Gerald Beyer, Eric Beyne, Kristof Croes:
TSV process-induced MOS reliability degradation. IRPS 2018: 5
2014
[j11]
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  dblp key:
  - journals/mr/LiHBSWSBBWC14
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  persistent URL:
  - https://dblp.org/rec/journals/mr/LiHBSWSBBWC14
Yunlong Li, Stefaan Van Huylenbroeck, Els Van Besien, Xiaoping Shi, Chen Wu, Michele Stucchi, Gerald Beyer, Eric Beyne, Ingrid De Wolf, Kristof Croes:
Reliability challenges for barrier/liner system in high aspect ratio through silicon vias. Microelectron. Reliab. 54(9-10): 1949-1952 (2014)

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