Zhengxuan Zhang

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Ming Chen 0007

> Home > Persons > Zhengxuan Zhang

Publications

2013
[j7]
- view
  authority control:
- export record
  dblp key:
  - journals/mj/NingBHZCZ13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/NingBHZCZ13
Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Ming Chen, Shichang Zou:
Comprehensive study on the TID effects of 0.13 μm partially depleted SOI NMOSFETs. Microelectron. J. 44(2): 86-93 (2013)
[j6]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/NingBHZHCZ13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/NingBHZHCZ13
Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Zhiyuan Hu, Ming Chen, Shichang Zou:
Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs. Microelectron. Reliab. 53(2): 259-264 (2013)
2012
[j5]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/NingZLHCBZ12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/NingZLHCBZ12
Bingxu Ning, Zhengxuan Zhang, Zhangli Liu, Zhiyuan Hu, Ming Chen, Dawei Bi, Shichang Zou:
Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology. Microelectron. Reliab. 52(1): 130-136 (2012)
2011
[j4]
- view
  authority control:
- export record
  dblp key:
  - journals/mj/HuLSZNCBZ11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/HuLSZNCBZ11
Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou:
Impact of within-wafer process variability on radiation response. Microelectron. J. 42(6): 883-888 (2011)
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/mj/NingHZLCBZ11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/NingHZLCBZ11
Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Zhangli Liu, Ming Chen, Dawei Bi, Shichang Zou:
The impact of total ionizing radiation on body effect. Microelectron. J. 42(12): 1396-1399 (2011)
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/LiuHZSCBNZ11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LiuHZSCBNZ11
Zhangli Liu, Zhiyuan Hu, Zhengxuan Zhang, Hua Shao, Ming Chen, Dawei Bi, Bingxu Ning, Shichang Zou:
Comparison of TID response in core, input/output and high voltage transistors for flash memory. Microelectron. Reliab. 51(6): 1148-1151 (2011)
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/HuLSZNCBZ11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/HuLSZNCBZ11
Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou:
Total ionizing dose effects in elementary devices for 180-nm flash technologies. Microelectron. Reliab. 51(8): 1295-1301 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.