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ORCIDFriedrich Taenzler
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2010 – 2019
- 2014
[c11]Bruce C. Kim, Saikat Mondal, Friedrich Taenzler, Kenneth Moushegian:
A novel BIST technique for LDMOS drivers. MWSCAS 2014: 1069-1072- [c10]Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao:
Development and empirical verification of an accuracy model for the power down leakage tests. VTS 2014: 1-6 - 2013
- [j5]Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi:
Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electron. Test. 29(6): 745-762 (2013) - [c9]Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian:
Physics Based Fault Models for Testing High-Voltage LDMOS. VLSI Design 2013: 285-290 - 2012
- [j4]Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya:
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1088-1101 (2012) - 2011
- [j3]Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force:
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electron. Test. 27(3): 241-252 (2011) - 2010
- [j2]Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler:
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems. IEEE Des. Test Comput. 27(6): 6-17 (2010) - [c8]Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed:
RADPro: Automatic RF analyzer and diagnostic program generation tool. ITC 2010: 325-333 - [c7]Abhijit Chatterjee, Friedrich Taenzler:
Low cost test and tuning of RF circuits and systems. VTS 2010: 42
2000 – 2009
- 2008
- [j1]Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee:
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. IEEE Des. Test Comput. 25(2): 150-159 (2008) - [c6]Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler:
Optimized EVM Testing for IEEE 802.11a/n RF ICs. ITC 2008: 1-10 - [c5]Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler:
Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. ITC 2008: 1-9 - 2007
- [c4]Friedrich Taenzler:
Production Test of High Volume Commercial RFIC. ATS 2007: 476 - 2006
- [c3]Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee:
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. DATE 2006: 658-663 - [c2]Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler:
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. VTS 2006: 222-227
1990 – 1999
- 1993
- [c1]Friedrich Taenzler, Thomas Novak, Erich Kubalek:
Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing. VTS 1993: 120-122
Coauthor Index
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