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Angelo Visconti
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2020 – today
- 2024
- [c6]Devanarayanan Ettisserry, Angelo Visconti, Mauro Bonanomi, Riccardo Pazzocco, Andrea Locatelli, Alessandro Sebastiani, Ashonita Chavan, Matthew Hollander, Giorgio Servalli, Alessandro Calderoni, Nirmal Ramaswamy:
Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM. IRPS 2024: 1-8
2010 – 2019
- 2017
- [j4]Christian Monzio Compagnoni, Akira Goda, Alessandro S. Spinelli, Peter Feeley, Andrea L. Lacaita, Angelo Visconti:
Reviewing the Evolution of the NAND Flash Technology. Proc. IEEE 105(9): 1609-1633 (2017) - 2014
- [c5]Giovanni M. Paolucci, M. Bertuccio, C. Monzio Compagnoni, Silvia Beltrami, Alessandro S. Spinelli, Andrea L. Lacaita, Angelo Visconti:
Cycling-induced threshold-voltage instabilities in nanoscale NAND flash memories: Sensitivity to the array background pattern. ESSDERC 2014: 54-57 - 2013
- [c4]Marcello Calabrese, Carmine Miccoli, Christian Monzio Compagnoni, Luca Chiavarone, Silvia Beltrami, Andrea Parisi, Sebastiano Bartolone, Andrea L. Lacaita, Alessandro S. Spinelli, Angelo Visconti:
Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology. ICICDT 2013: 37-40 - 2010
- [j3]Simone Gerardin, Marta Bagatin, Alessandro Paccagnella, G. Cellere, Angelo Visconti, Mauro Bonanomi:
Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectron. Reliab. 50(9-11): 1837-1841 (2010)
2000 – 2009
- 2007
- [c3]Marta Bagatin, Giorgio Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone:
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151 - 2006
- [c2]G. Cellere, Alessandro Paccagnella, Angelo Visconti, Mauro Bonanomi:
Erratic Effects of Irradiation in Floating Gate Memory Cells. IOLTS 2006: 51-56 - 2005
- [c1]G. Cellere, Alessandro Paccagnella, Angelo Visconti, Mauro Bonanomi:
Soft Errors induced by single heavy ions in Floating Gate memory arrays. DFT 2005: 275-284 - 2003
- [j2]Roberto Bez, Emilio Camerlenghi, Alberto Modelli, Angelo Visconti:
Introduction to flash memory. Proc. IEEE 91(4): 489-502 (2003) - 2000
- [j1]Giovanni Campardo, Rino Micheloni, Stefano Commodaro, Emilio Yero, Matteo Zammattio, Sabina Mognoni, Andrea Sacco, Massimiliano Picca, Alessandro Manstretta, Marco Scotti, Ilaria Motta, C. Golla, Andrea Pierin, Roberto Bez, Alessandro Grossi, Alberto Modelli, Angelo Visconti, Osama Khouri, Guido Torelli:
40-mm2 3-V-only 50-MHz 64-Mb 2-b/cell CHE NOR flash memory. IEEE J. Solid State Circuits 35(11): 1655-1667 (2000)
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