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H. M. Shin

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2020 – today

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2023
[c2]
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  dblp key:
  - conf/irps/SatoSJLBKRLHJLKLLPSJSKK23
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  - https://dblp.org/rec/conf/irps/SatoSJLBKRLHJLKLLPSJSKK23
Hideo Sato, H. M. Shin, H. Jung, S. W. Lee, H. Bae, H. Kwon, K. H. Ryu, W. C. Lim, Y. S. Han, J. H. Jeong, J. M. Lee, D. S. Kim, K. Lee, J. H. Lee, J. H. Park, Y. J. Song, Y. Ji, B. I. Seo, J. W. Kim, H. H. Kim:
Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM. IRPS 2023: 1-5

2010 – 2019

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2019
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  - conf/irps/JiGLLLUPHSLSLSH19
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Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, Taiki Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S. H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, Gwanhyeob Koh, K. C. Park, Sangwoo Pae, Gi-Tae Jeong, J. S. Yoon, E. S. Jung:
Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. IRPS 2019: 1-3

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