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Jhon Gomez
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2020 – today
- 2023
- [j3]Nektar Xama
, Jhon Gomez
, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette
, Georges G. E. Gielen
:
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(10): 3426-3435 (2023) - [c7]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. ETS 2023: 1-4 - 2022
- [j2]Jhon Gomez
, Nektar Xama
, Anthony Coyette
, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4771-4781 (2022) - [c6]Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback
, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella
, Sandro Sartoni, Matteo Sonza Reorda
, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu:
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS 2022: 1-10 - 2020
- [j1]Nektar Xama
, Martin Andraud
, Jhon Gomez
, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst. 25(5): 47:1-47:27 (2020) - [c5]Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez
, Georges G. E. Gielen:
Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. ETS 2020: 1-6 - [c4]Nektar Xama
, Jakob Raymaekers, Martin Andraud
, Jhon Gomez
, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. ETS 2020: 1-6 - [c3]Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez
, Georges G. E. Gielen:
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ITC 2020: 1-10 - [c2]Jhon Gomez
, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. VTS 2020: 1-6
2010 – 2019
- 2019
- [c1]Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama
, Jhon Gomez
, Georges G. E. Gielen:
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. ITC 2019: 1-4
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