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ORCIDM. Natarajan Iyer
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2000 – 2009
- 2009
[j7]Dimitri Linten, Steven Thijs, Jonathan Borremans, Morin Dehan, David Trémouilles
, Mirko Scholz, M. I. Natarajan, Piet Wambacq, Stefaan Decoutere, Guido Groeseneken:
A plug-and-play wideband RF circuit ESD protection methodology: T-diodes. Microelectron. Reliab. 49(12): 1440-1446 (2009)- 2007
- [j6]David Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken:
Transient voltage overshoot in TLP testing - Real or artifact? Microelectron. Reliab. 47(7): 1016-1024 (2007) - 2006
- [j5]Steven Thijs, M. Natarajan Iyer, Dimitri Linten, Wutthinan Jeamsaksiri, T. Daenen, Robin Degraeve, Andries J. Scholten, Stefaan Decoutere, Guido Groeseneken:
Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions. Microelectron. Reliab. 46(5-6): 702-712 (2006) - 2005
- [j4]Vesselin K. Vassilev, Steven Thijs, P. L. Segura, Piet Wambacq, Paul Leroux, Guido Groeseneken, M. I. Natarajan, Herman E. Maes, Michiel Steyaert:
ESD-RF co-design methodology for the state of the art RF-CMOS blocks. Microelectron. Reliab. 45(2): 255-268 (2005) - [c2]Philippe Jansen, Steven Thijs, Dimitri Linten, M. I. Natarajan, Vesselin K. Vassilev, Mingxu Liu, Ann Concannon, David Trémouilles, Takeshi Nakaie, Masanori Sawada, Vladislav A. Vashchenko, Marcel ter Beek, Takumi Hasebe, Stefaan Decoutere, Guido Groeseneken:
RF ESD protection strategies - the design and performance trade-off challenges. CICC 2005: 489-496 - [c1]Dimitri Linten, Xiao Sun, Steven Thijs, M. I. Natarajan, Abdelkarim Mercha, Geert Carchon, Piet Wambacq, Takeshi Nakaie, Stefaan Decoutere:
Low-power low-noise highly ESD robust LNA, and VCO design using above-IC inductors. CICC 2005: 497-500 - 2004
- [j3]Vesselin K. Vassilev, Vladislav A. Vashchenko, Philippe Jansen, B.-J. Choi, Ann Concannon, J.-J. Yang, Guido Groeseneken, M. I. Natarajan, Marcel ter Beek, Peter Hopper, Michiel Steyaert, Herman E. Maes:
A CAD assisted design and optimisation methodology for over-voltage ESD protection circuits. Microelectron. Reliab. 44(9-11): 1885-1890 (2004) - 2003
- [j2]Vesselin K. Vassilev, Snezana Jenei, Guido Groeseneken, Rafael Venegas, Steven Thijs, Vincent De Heyn, M. Natarajan Iyer, Michiel Steyaert, Herman E. Maes:
High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectron. Reliab. 43(7): 1011-1020 (2003) - 2002
- [j1]Bart Keppens, Vincent De Heyn, M. Natarajan Iyer, Vesselin K. Vassilev, Guido Groeseneken:
Significance of the failure criterion on transmission line pulse testing. Microelectron. Reliab. 42(6): 901-907 (2002)
Coauthor Index
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