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ORCIDSoh Yun Siah
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2020 – today
- 2020
[c1]Tae Young Lee
, Kazutaka Yamane, Lee Yong Hau, Robin Chao, Nyuk Leong Chung, Vinayak Bharat Naik, K. Sivabalan, Jae Hyun Kwon, Jia Hao Lim, Wah-Peng Neo, Kevin Khua, Naganivetha Thiyagarajah, Suk Hee Jang, Behtash Behin-Aein, Eng-Huat Toh, Yuichi Otani, Dinggui Zeng, Nivetha Balasankaran, Lian Choo Goh, Timothy Ling, Jay Hwang, Lei Zhang, Rachel Low, Soon Leng Tan, Chim Seng Seet, Jia Wen Ting, Stanley Ong, Young Seon You, Swee Tuck Woo, Elgin Quek, Soh Yun Siah:
Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production. IRPS 2020: 1-4
2010 – 2019
- 2012
- [j5]Wai Shing Lau, Peizhen Yang, Soh Yun Siah, Lap Chan:
The role of a tensile stress bias for a sensitive silicon mechanical stress sensor based on a change in gate-induced-drain leakage current. Microelectron. Reliab. 52(11): 2847-2850 (2012) - 2010
- [j4]Wai Shing Lau, Peizhen Yang, Eng Hua Lim, Yee Ling Tang, Seow Wei Lai, V. L. Lo, Soh Yun Siah, Lap Chan:
Observation of halo implant from the drain side reaching the source side and vice versa in extremely short p-channel transistors. Microelectron. Reliab. 50(3): 346-350 (2010)
2000 – 2009
- 2009
- [j3]Wai Shing Lau, Peizhen Yang, Jason Zhiwei Chian, V. Ho, C. H. Loh, Soh Yun Siah, Lap Chan:
Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors. Microelectron. Reliab. 49(1): 1-7 (2009) - 2008
- [j2]Wai Shing Lau, Peizhen Yang, Chee Wee Eng, V. Ho, C. H. Loh, Soh Yun Siah, David Vigar, Lap Chan:
A study of the linearity between Ion and log Ioff of modern MOS transistors and its application to stress engineering. Microelectron. Reliab. 48(4): 497-503 (2008) - [j1]Wai Shing Lau, Peizhen Yang, V. Ho, L. F. Toh, Y. Liu, Soh Yun Siah, Lap Chan:
An explanation of the dependence of the effective saturation velocity on gate voltage in sub-0.1 µm metal-oxide-semiconductor transistors by quasi-ballistic transport theory. Microelectron. Reliab. 48(10): 1641-1648 (2008)
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