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David Flores
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2020 – today
- 2023
- [j15]Albert Doblas, David Flores, Salvador Hidalgo
, Neil Moffat, Giulio Pellegrini
, David Quirion
, Jairo Villegas, Dzmitry Maneuski, Marie Ruat, Pablo Fajardo
:
Inverse LGAD (iLGAD) Periphery Optimization for Surface Damage Irradiation. Sensors 23(7): 3450 (2023) - 2022
- [c4]Stefania Pareti, David Flores, Viviana Gonzalez, Martina Pareti:
Networks, smart city governance and community rituals as mechanisms for reducing the vulnerability of cities. The case of the Chilota "minga", Chiloé, Chile. ANT/EDI40 2022: 72-78 - [c3]Stefania Pareti, David Flores, Loreto Rudolph, Vicente Valdebenito:
E-Business and E-Commerce as facilitators of digital consumption of art. The case of Gallery Weekend Santiago and Mexico. MSIE 2022: 17-22 - [c2]Stefania Pareti, David Flores, Loreto Rudolph, Martina Pareti:
Planning and Design Challenges for Smart Infrastructures: The Chiloé Island Case. SMARTGREENS 2022: 103-109 - 2021
- [c1]Kyle Rong
, Aditya Khant
, David Flores
, George D. Montañez
:
The Label Recorder Method - Testing the Memorization Capacity of Machine Learning Models. LOD 2021: 581-595 - [i1]Sonia Sehra, David Flores, George D. Montañez:
Undecidability of Underfitting in Learning Algorithms. CoRR abs/2102.02850 (2021)
2010 – 2019
- 2014
- [j14]Jesús Urresti
, Salvador Hidalgo
, David Flores
, Daniel Fernández Hevia:
3.3 kV PT-IGBT with voltage-sensor monolithically integrated. IET Circuits Devices Syst. 8(3): 182-187 (2014) - [j13]Ihsan Supono, Jesús Urresti
, Alberto Castellazzi
, David Flores
:
Overload robust IGBT design for SSCB application. Microelectron. Reliab. 54(9-10): 1906-1910 (2014) - 2012
- [j12]Pablo Fernández-Martínez
, Francisco Rogelio Palomo
, S. Díez, Salvador Hidalgo
, Miguel Ullán, David Flores
, Roland Sorge:
Simulation methodology for dose effects in lateral DMOS transistors. Microelectron. J. 43(1): 50-56 (2012) - [j11]Ana Villamor-Baliarda, Piet Vanmeerbeek, Michele Riccio
, Vincenzo d'Alessandro
, Andrea Irace
, Jaume Roig, David Flores
, Peter Moens:
Influence of charge balance on the robustness of trench-based super junction diodes. Microelectron. Reliab. 52(9-10): 2409-2413 (2012) - 2011
- [j10]Ana Villamor-Baliarda, Piet Vanmeerbeek, Jaume Roig, Peter Moens, David Flores
:
Electric field unbalance for robust floating ring termination. Microelectron. Reliab. 51(9-11): 1959-1963 (2011)
2000 – 2009
- 2008
- [j9]Ignasi Cortés, Pablo Fernández-Martínez
, David Flores
, Salvador Hidalgo
, José Rebollo
:
Superjunction LDMOS on thick-SOI technology for RF applications. Microelectron. J. 39(6): 922-927 (2008) - [j8]Ignasi Cortés, Pablo Fernández-Martínez
, David Flores
, Salvador Hidalgo
, José Rebollo
:
Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors. Microelectron. Reliab. 48(2): 173-180 (2008) - 2005
- [j7]Ignasi Cortés, Jaume Roig, David Flores
, Jesús Urresti
, Salvador Hidalgo
, José Rebollo
:
Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. Microelectron. Reliab. 45(3-4): 493-498 (2005) - [j6]Jesús Urresti
, Salvador Hidalgo
, David Flores
, Jaume Roig, Ignasi Cortés, José Rebollo
:
Lateral punch-through TVS devices for on-chip protection in low-voltage applications. Microelectron. Reliab. 45(7-8): 1181-1186 (2005) - 2004
- [j5]Miquel Vellvehí
, David Flores
, Xavier Jordà
, Salvador Hidalgo
, José Rebollo
, L. Coulbeck, P. Waind:
Design considerations for 6.5 kV IGBT devices. Microelectron. J. 35(3): 269-275 (2004) - [j4]Jaume Roig, David Flores
, Salvador Hidalgo
, José Rebollo
, José Millán:
Thin-film silicon-on-sapphire LDMOS structures for RF power amplifier applications. Microelectron. J. 35(3): 291-297 (2004) - 2003
- [j3]Jesús Urresti
, Salvador Hidalgo
, David Flores
, Jaume Roig, José Rebollo
, I. Mazarredo:
Optimisation of very low voltage TVS protection devices. Microelectron. J. 34(9): 809-813 (2003) - [j2]Salvador Hidalgo
, David Flores
, Isabel Obieta
, I. Mazarredo:
Passivation and packaging of positive bevelled edge termination and related electrical stability. Microelectron. Reliab. 43(3): 413-420 (2003) - 2002
- [j1]Jaume Roig, David Flores
, Miquel Vellvehí
, José Rebollo
, José Millán:
Reduction of self-heating effect on SOIM devices. Microelectron. Reliab. 42(1): 61-66 (2002)
Coauthor Index
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