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2020 – today
- 2021
[i1]Thomas Abbey, Alexantrou Serb, Spyros Stathopoulos, Loukas Michalas, Themis Prodromakis:
Emulating homoeostatic effects with metal-oxide memristors T-dependence. CoRR abs/2110.04102 (2021)
2010 – 2019
- 2019
- [c5]Georgios Papandroulidakis
, Loukas Michalas, Alexander Serb, Ali Khiat, Geoff V. Merrett, Themistoklis Prodromakis:
A Digital In-Analogue Out Logic Gate Based on Metal-Oxide Memristor Devices. ISCAS 2019: 1-5 - 2018
- [c4]Thomas Abbey, Alexander Serb, Nikolaos Vasilakis, Loukas Michalas, Ali Khiat, Spyros Stathopoulos, Themis Prodromakis:
Live Demonstration: An Embedded Environmental Control Micro-chamber System for RRAM Memristor Characterisation. ISCAS 2018: 1- - [c3]Thomas Abbey, Alexandru Serb, Nikolaos Vasilakis, Loukas Michalas, Ali Khiat, Spyros Stathopoulos, Themis Prodromakis:
An Embedded Environmental Control Micro-chamber System for RRAM Memristor Characterisation. ISCAS 2018: 1-4 - [c2]Georgios Papandroulidakis, Ali Khiat, Alexander Serb, Spyros Stathopoulos, Loukas Michalas, Themis Prodromakis:
Metal Oxide-enabled Reconfigurable Memristive Threshold Logic Gates. ISCAS 2018: 1-5 - 2016
- [j12]Matroni Koutsoureli, Athanasios Zevgolatis, Samuel Saada, Christine Mer-Calfati, Loukas Michalas, George J. Papaioannou, Philippe Bergonzo:
Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness. Microelectron. Reliab. 64: 660-664 (2016) - [j11]Matroni Koutsoureli, Dimitrios Birmpiliotis, Loukas Michalas, George J. Papaioannou:
An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches. Microelectron. Reliab. 64: 688-692 (2016) - 2015
- [j10]Loukas Michalas, Matroni Koutsoureli, E. Papandreou, Flavio Giacomozzi, George J. Papaioannou:
Dielectric charging effects in floating electrode MEMS capacitive switches. Microelectron. Reliab. 55(9-10): 1891-1895 (2015) - [j9]Matroni Koutsoureli, Loukas Michalas, E. Papandreou, George J. Papaioannou:
Induced charging phenomena on SiNx dielectric films used in RF MEMS capacitive switches. Microelectron. Reliab. 55(9-10): 1911-1915 (2015) - [c1]Panagiotis Giounanlis, Elena Blokhina, Orla Feely, Loukas Michalas, Matroni Koutsoureli, George J. Papaioannou:
Modelling of the dynamical behaviour of floating electrode MEMS. ISCAS 2015: 1322-1325 - 2014
- [j8]Matroni Koutsoureli, Loukas Michalas, Anestis Gantis, George J. Papaioannou:
A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches. Microelectron. Reliab. 54(9-10): 2159-2163 (2014) - 2013
- [j7]Matroni Koutsoureli, Loukas Michalas, P. Martins, E. Papandreou, A. Leuliet, S. Bansropun, George J. Papaioannou, A. Ziaei:
Properties of contactless and contacted charging in MEMS capacitive switches. Microelectron. Reliab. 53(9-11): 1655-1658 (2013) - 2012
- [j6]Matroni Koutsoureli, Loukas Michalas, George J. Papaioannou:
Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches. Microelectron. Reliab. 52(9-10): 2240-2244 (2012) - [j5]Loukas Michalas, Anurag Garg, Ayyaswamy Venkattraman, Matroni Koutsoureli, Alina A. Alexeenko, Dimitrios Peroulis, George J. Papaioannou:
A study of field emission process in electrostatically actuated MEMS switches. Microelectron. Reliab. 52(9-10): 2267-2271 (2012) - [j4]Loukas Michalas, Anastasia Syntychaki, Matroni Koutsoureli, George J. Papaioannou, Apostolos T. Voutsas:
A temperature study of photosensitivity in SLS polycrystalline silicon TFTs. Microelectron. Reliab. 52(9-10): 2508-2511 (2012) - 2010
- [j3]Loukas Michalas, George J. Papaioannou, Apostolos T. Voutsas:
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress. Microelectron. Reliab. 50(9-11): 1848-1851 (2010)
2000 – 2009
- 2007
- [j2]Loukas Michalas, M. A. Exarchos, George J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. Microelectron. Reliab. 47(12): 2058-2064 (2007) - 2004
- [j1]Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis:
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 44(9-11): 1631-1636 (2004)
Coauthor Index
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